Kyushu University Academic Staff Educational and Research Activities Database
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Itakura Masaru Last modified date:2024.06.03



Graduate School
Undergraduate School


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Homepage
https://kyushu-u.elsevierpure.com/en/persons/masaru-itakura
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https://hiroshiakaminejp.wixsite.com/crystalphyslab-eng
Itakura Laboratory Homepage .
Phone
092-583-7535
Fax
092-583-7534
Academic Degree
Dr. Eng.
Country of degree conferring institution (Overseas)
No
Field of Specialization
Physical Metallurgy, Solid State Physics, Electron Microscopy
Total Priod of education and research career in the foreign country
00years00months
Outline Activities
From April 1988 to March 1998, I worked as an assistant professor at the Graduate School of Science and Engineering, and continued to work as a lecturer from April 1998, and have been working as an associate professor since October 1999 and as an associate professor since April 2007.

My main research themes are (1) microstructure and magnetic properties of neodymium magnet materials, (2) microstructural analysis of silicide environmental semiconductor thin films, (3) creation and microstructural analysis of new boron-based hydrogen storage alloys, (4) X-ray absorption near-edge structure spectrum measurement under high pressure using synchrotron radiation, (5) crystal structure and anomalous properties of 4f electron alloys under low temperature and high pressure, and (6) phase transformation process of long-period structures. I am conducting research on a wide range of themes, from basic research on the phase transformation process of alloys to research on microstructure control of next-generation permanent magnet materials.

I also participate in the Ministry of Education, Culture, Sports, Science and Technology's "Nanotechnology Support Project", JST Industry-Academia Collaborative Basic Research, and NEDO's "New High-Performance Magnetic Material Exploration Project", and am actively conducting joint research with other universities and companies.

In graduate school education, I provide research guidance to graduate students through their master's and doctoral theses. In addition, I offer "Fundamentals of Electronic Physics," "Fundamentals of Functional Materials Engineering," and "Special Topics in Crystal Physics Engineering," which focus on the properties of materials, mainly metals and ceramics, and their evaluation methods. I also offer "Fundamentals of Solid State Physics I" and "Advanced Solid State Physics," in an effort to improve the basic knowledge of graduate students.

In undergraduate education, I am involved in student experiments and exercises, and also give lectures on phase diagrams such as "Materials Structure Control" and "Phase Equilibrium Theory," as well as the basics of magnetic materials. I also supervise the graduation research of fourth-year undergraduate students. Furthermore, since April 2017, I have also been in charge of lectures on "Fundamentals of Mechanics," and am involved in core education.
Research
Research Interests
  • Microstructural analysis of soft magnetic multilayered thick films fabricated by high-speed pulsed laser deposition
    keyword : soft magnetic materials, magnetic thin films, pulsed laser deposition, electron microscopy, elemental analysis
    2020.04~2024.03.
  • Study on microstructure change of HDDR-made Nd-Fe-B magnetic powders with degradation of coercivities
    keyword : neodymium magnets, coercivity, electron microscopy, elemental analysis
    2019.04~2024.03.
  • Microstructure analysis of ThMn12-type SmFe12 thin film magnets
    keyword : permanent magnets, thin film magnets, scanning transmission electron microscopy, oriented growth
    2021.04~2024.03.
  • Microstructure and coercivity saturation phenomenon in Nd-Fe-B sintered magnets with Tb grain boundary diffusion treatment
    keyword : neodymium magnets, grain boundary diffusion, coercivity, electron microscopy, elemental analysis
    2020.04~2023.03.
  • Application of rare earth based multi-layered thick film magnets with in-plane anisotropy for ultra-miniature devices
    keyword : neodymium magnets, thin film magnets, electron microscopey, elemental analysis
    2019.04~2023.03.
  • Development of SEM contrast-enhanced observation method for low-accelerated secondary electron images
    keyword : scanning electron microscopy, LV-SEM, image contrasts, secondary electron image
    2019.04~2021.03.
  • Application of rare earth based multi-layered thick film magnets with in-plane anisotropy for ultra-miniature devices
    keyword : neodymium magnets, thick-film magnets,pulsed laser deposition, electron microscope, elemental analysis
    2019.04~2022.03.
  • Development of innovative exchange coupling magnets with an excellent high temperature resistivity
    keyword : rare earth magnets, scanning electron microscopy, scanning transmission electron microscopy, elemental analysis
    2017.04~2019.03Microstructural analysis of melting lateral growth GOI thin films on Si substrate.
  • Development of infrared sensor of magnesium silicide corresponding to the resource and the environmental risk
    keyword : environmentally friendly semiconductors, silicide, scanning electron microscopy, scanning transmission electron microscopy
    2017.04~2019.03Microstructural analysis of melting lateral growth GOI thin films on Si substrate.
  • Development of nano-composite multilayered magnet films with controlled the interfaces
    keyword : neodymium magnets, thin film magnets, scanning transmission electron microscopy, elemental analysis
    2016.04~2018.03Microstructural analysis of melting lateral growth GOI thin films on Si substrate.
  • Development and micro-fabrication of sub-mirimetor sized thick-film magnets by high-speed deposition for MEMS applications
    keyword : neodymium magnets, thick-film magnets, scanning electron microscopy, scanning transmission electron microscopy, elemental analysis
    2015.04~2017.03Microstructural analysis of melting lateral growth GOI thin films on Si substrate.
  • Atomic resolution microstructure analysis of high performance NdFeB-based model magnets
    keyword : neodymium magnet, scanning transmission electron microscopy, atomic resolution, elemental analysis
    2015.04~2017.03Microstructural analysis of melting lateral growth GOI thin films on Si substrate.
  • Atomic resolution microstructure and chemical analysis of Sm-Co/α-Fe nanocomposite magnets
    keyword : rare earth magnets, thin film magnets, scanning transmission electron microscopy, elemental analysis
    2015.04~2017.03Microstructural analysis of melting lateral growth GOI thin films on Si substrate.
  • Atomic resolution microstructure analysis of high performance hard magnetic materials controlled by nano-scale microstructure
    keyword : neodymium magnet, scanning transmission electron microscopy, atomic resolution, elemental analysis
    2014.04~2016.03Microstructural analysis of melting lateral growth GOI thin films on Si substrate.
  • Fabrication of silicide nano-bulk crystals and their application for thermo-electronic devices
    keyword : environmentally friendly semiconductors, silicide, thermoelectric materials, scanning transmission electron microscopy
    2013.04~2015.03Microstructural analysis of melting lateral growth GOI thin films on Si substrate.
  • Development of nano-columnar-type anisotropic nano-composite thick film magnets and their applications for next-generation magnetic devices
    keyword : neodymium magnet, thick-film magnet, scanning transmission electron microscopy, composition analysis
    2013.04~2016.03Microstructural analysis of melting lateral growth GOI thin films on Si substrate.
  • Control of anisotropic texture of NdFeB-type magnets by real dimensional microscopic analysis
    keyword : neodymium magnet, oriented texture, scanning transmission electron microscopy, composition analysis
    2012.04~2016.03Microstructural analysis of melting lateral growth GOI thin films on Si substrate.
  • Search and microstructure control of new magnetic materials by using non-equilibrium phase
    keyword : permanent magnet, non-equilibrium phase, scanning electron microscopy, transmission electron microscopy
    2011.10~2013.03Microstructural analysis of melting lateral growth GOI thin films on Si substrate.
  • Microstructures analysis of Mn-silicides
    keyword : environmentally friendly semiconductors, silicide, thermoelectric materials, scanning electron microscopy, transmission electron microscopy
    2011.04~2012.03Microstructural analysis of melting lateral growth GOI thin films on Si substrate.
  • Microstructures analysis of Nd-Fe-B based magnet powders fabricated by HDDR process
    keyword : neodymium magnet, hydrogen treatment, scanning electron microscopy, transmission electron microscopy
    2011.04~2016.03Microstructural analysis of melting lateral growth GOI thin films on Si substrate.
  • Microstructures analysis of Nd-Fe-B based die-upset magnets
    keyword : neodymium magnets, hot-deformed magnets, coercivity, scanning electron microscopy, transmission electron microscopy
    2010.04~2013.03Microstructural analysis of melting lateral growth GOI thin films on Si substrate.
  • Microstructures and coercivities of hydrogenated Nd-Fe-B based magnets
    keyword : neodymium magnets, sintered magnets, coercivity, scanning electron microscopy, transmission electron microscopy
    2009.04~2012.03Microstructural analysis of melting lateral growth GOI thin films on Si substrate.
  • Microstructure analysis of GOI thin films fabricated by lateral liquid phase epitaxy method
    keyword : Ge thin film, growth orientation control, scanning electron microscopy, transmission electron microscopy
    2008.06~2012.03Microstructural analysis of melting lateral growth GOI thin films on Si substrate.
  • Microstructure analysis of Si-Ge thin films fabricated by Al-induced crystallization
    keyword : silicon-based semiconductors, low-temperature crystallization, scanning electron microscopy, transmission electron microscopy
    2008.04~2011.03Microstructure analysis of Si-Ge thin film fabricated by Aluminum Induced Crystallization method.
  • Low temperature crystallization mechanism for the indentation-induced crystallization of a-SiGe thin films
    keyword : silicon-based semiconductors, low-temperature crystallization, scanning electron microscopy, transmission electron microscopy
    2008.02~2011.03Low temperature crystallization mechanism of amorphous SiGe thin filmes crystallized by nano-indentation method.
  • Microstructure analysis of semiconductor thin film materials by using low-voltage scanning electron microscope
    keyword : scanning electron microscopy, secondary electron images, image contrasts, LV-SEM
    2006.04~2010.03.
  • Microstructure analysis of epitaxial grown beta-FeSi2 thin films
    keyword : environmentally friendly semiconductors, iron silicide, epitaxial growth, transmission electron microscopy
    2006.06~2010.03.
  • Microstructure analysis of high-quality crystalline beta-FeSi2 thin film fabricated by MOCVD method
    keyword : environmentally friendly semiconductors, iron silicide, luminescent materials, transmission electron microscopy, elemental analysis
    2009.06~2012.03.
  • Microstructure analysis of NdFeB sintered magnets improved by Tb vapor sorption treatment
    keyword : neodymium magnet, grain boundary diffusion, high coercivity, transmission electron microscopy, elemental analysis
    2005.06~2012.03Microstructure Analysis of Nd-Fe-B sintered magnets improved by Tb metal vapor sorption.
  • Microstructure analysis of Nd-Fe-B thin film magnets fabricated by pulsed laser deposition
    keyword : neodymium magnets, thick-film magnets, transmission electron microscopy, elemental analysis
    2005.06~2007.03.
  • Microstructure analysis of Zn-ferrite coated iron soft-magnetic compound materials
    keyword : soft magnetic materials, transmission electron microscopy, elemental analysis
    2004.04~2007.06.
  • Microstructures of [Fe3Si/FeSi2] magnetic semiconductor thin films
    keyword : magnetic semiconductor, magnetic thin film, transmission electron microscopy, ordered structure
    2004.04~2008.03Microstructure analysis of [Fe3Si/FeSi2] multilayered thin films on Si(111) substrates.
  • Microstructure analysis of amorphous SiGe thin film crystallized by Ni-MILC method
    keyword : silicon-based semiconductors, low-temperature crystallization, scanning electron microscopy, transmission electron microscopy, elemental analysis
    2003.07~2008.03Characterization of Metal-Induced Lateral Crystallization of Amorphous SiGe on Insulating Film.
  • Microstructural analysis of β-FeSi2 nano-crystalline thin films
    keyword : environmentally friendly semiconductors, Ion beam synthesis, thin films, luminescent materials, transmission electron microscopy
    2002.06~2007.03Microstructural analysis of β-FeSi2 nano-crystalline thin films.
  • Microstructures of NdFeB magnetic powder and effect of Zn-coating on corrosion resistance
    keyword : electromagnetic wave absorbing materials, hydrogen treatment, transmission electron microscopy
    2002.04~2007.03Microstructures of NdFeB magnetic powder and effect of Zn-coating on corrosion resistance.
  • Characterization and Controlling of Microstructures of NdFeB-HDDR Powders for High Magnetic Properties
    keyword : electromagnetic wave absorbing materials, hydrogen treatment, transmission electron microscopy
    2000.04~2003.10Characterization and Controlling of Microstructures of NdFeB-HDDR Powders for High Magnetic Properties.
  • Fabrication and Microstructural analysis of PLD-made Diamond Thin Films
    keyword : diamond thin film, pulsed laser deposition, transmission electron microscopy
    2002.09~2005.03Microstructure of nanocrystalline diamond film prepared by pulsed laser deposition.
  • Hydrogen absorption properties and microstructure of new boron intermetallic compounds
    keyword : environmentally friendly semiconductors, sputtered thin film, silicide, transmission electron microscopy
    2000.04~2002.03Hydrogen absorption properties and microstructure of new boron intermetallic compounds.
  • Nanostructure analysis of sputtered thin films of silicide semiconductors
    keyword : environmentally friendly semiconductors, sputtered thin film, silicide, transmission electron microscopy
    2001.05~2007.03TEM analysis of epitaxial growth processes in the sputtered β-FeSi2/Si(001) films.
  • Microstructures of Nd-Fe-B magnets produced by HDDR process
    keyword : neodymium magnet, hydrogen treatment, transmission electron microscopy, crystal orientation analysis
    1990.04~2000.03Characterization and Controlling of Microstructures of NdFeB-HDDR Powders for High Magnetic Properties.
  • Dynamics of phase transformation process for long period superstructure phase
    keyword : ordered alloy, phase transformation, long period superstructure, high resolution electron microscopy
    1998.04~1995.03Dynamics of phase transformation process for long period superstructure phase.
  • Crystal structures and physical properties of 4f-electron systems under high pressure
    keyword : rare earth alloys, f-electron systems, high pressure physical properties, Kondo effect, electrical resistivity anomaly
    1989.04~2000.03Crystal structures and physical properties of 4f-electron systems under high pressure.
Current and Past Project
  • The Nanotechnology Researchers Network Project (Nanonet Project) "Ultra High-voltage Transmission Electron Microscope"
  • Research Core at Kyushu University "inorganic nano-superstructure"
  • Research Core at Kyushu University "Super microscope sciences"
Academic Activities
Books
1. Electron Microscopy, Fundamental Techniques and Its Application 1998, pp.217-222 (1998)..
Reports
1. M. Itakura, N, Kishikawa, R. Kawashita, N. Kuwano, Epitaxial orientation and morphology of β-FeSi2 produced on a flat and a patterned Si(001) substrates, Annual Reports of HVEM Laboratory, Kyushu University, No. 30, 30号 (2006), 43-44, 2006.07.
2. M. Itakura, S. Masumori, Y. Tomokiyo, N. Kuwano, H. Kanno, T. Sadoh, M. Miyao, Microstructures of Si0.6Ge0.4 thin films fabricated by Ni-metal induced lateral crystallization, Annual Reports of HVEM Laboratory, Kyushu University, No. 30, 30号 (2006), 41-42, 2006.07.
3. M. Itakura, M. Ariyoshi, T. Fukuyama, N. Kuwano, Ce-LIII XANES and XRD measurements using an asymmetrical diamond anvil cell, Photon Factory Activity Report #20, 2002.10.
4. M. Itakura, M. Ariyoshi, T. Fukuyama, N. Kuwano, Ce-LIII XANES and XRD measurements using an asymmetrical diamond anvil cell, Photon Factory Activity Report, No. 20 (2002), 220., 2002.10.
5. M. Itakura, H. Maeda, T. Fukuyama, N. Kuwano, K. Oki, High Pressure Fluorescence Ce-LIII XANES Measurement and Its Application, Photon Factory Activity Report, No. 18 (2000), 99, 2000.10.
6. M. Itakura, A. Ako, N. Kuwano, K. Oki, High Pressure Ce-LIII XANES Measurement using a Diamond Anvil Cell, Photon Factory Activity Report, No. 17 (1999), 81, 1999.10.
7. M. Itakura, M. Nishimura, A. Ako, N. Kuwano, K. Oki, Ce-LIII X-ray Absorption Near Edge Structure Measurement using an Unsymmetrical Diamond Anvil Cell, Photon Factory Activity Report, No. 16 (1998), 208, 1998.10.
8. M. Itakura, M. Nishimura, S. Takase, N. Kuwano, K. Oki, New Method of Fluorescence Ce-L3 XANES Measurement using a Diamond Anvil Cell, Photon Factory Activity Report, No. 15 (1997), 116, 1997.10.
9. M. Itakura, N. Kuwano, Y. Ogata, N. Matsumoto, K. Oki, Observation of Pressure Induced 4f Electron Transition in an Amorphous Ce3Al Alloy by High Pressure Fluorescence XANES, Photon Factory Activity Report, No. 13 (1995), 237, 1995.10.
10. M. Itakura, Y. Aya, N. Kuwano, K. Oki,, Electrical Resistivity and Ce Valence Measurements Using XANES for a Pd5Ce Ordered Alloy, Photon Factory Activity Report, No. 9 (1991), 128, 1991.10.
11. Influence of Disordering upon Concentrated Kondo Effect for Pd7Ce Alloys.
12. Measurements of Mixed Valence of Ce by L3-XANES Analysis.
Papers
1. Masaru Itakura, Koichi Sugiyama, Hiroshi Akamine, Minoru Nishida, Michihide Nakamura, Tetsuhiko Mizoguchi, Takahiko Iriyama, Suppression mechanism of abnormal grain growth by Zr addition in pressless processed Nd-Fe-B sintered magnets, J. Alloy Comp., https://doi.org/10.1016/j.jallcom.2021.161244, 887, 161244-1-161244-11, 2021.07, Microstructures of pressless processed (PLP) Nd-Fe-B sintered magnets with and without Zr addition were investigated by scanning electron microscopy and scanning/transmission electron microscopy. In the Zr-free magnet, huge polygonal abnormal grains (AGs) about 100 times larger than the normal grain size were generated by PLP sintering at 975 °C. Electron backscattered diffraction analysis revealed that the PLP sintered magnet had a biaxial oriented texture of fine Nd2Fe14B grains with the orientation of the AGs significantly deviated from the biaxial oriented grains. By adding a small amount of Zr, fine plate-like Zr-B precipitates with a long period stacking ordered structure derived from the ZrB2 phase formed on the growth surfaces of Nd2Fe14B grains with a crystallographic orientation relationship. There were two Nd-rich grain boundary (GB) phases, namely, orthorhombic Nd3(Co, Cu) and metastable CaF2-NdO2, which became liquid during sintering. The boron consumption associated with the formation of Zr-B precipitates increased the Nd-rich GB phases, resulting in a homogeneous distribution of the liquid phase around the Nd2Fe14B grains. Therefore, the addition of Zr effectively suppressed the abnormal grain growth during PLP sintering owing to the pinning effect of the Zr-B precipitates and the formation of a homogeneous liquid phase distribution..
2. Masaru Itakura, Natsuki Watanabe, Minoru Nishida, 大尾 岳史, Syo Matsumura, Atomic-resolution X-ray Energy-dispersive Spectroscopy Chemical Mapping of Substitutional Dy Atoms in a High-coercivity Neodymium Magnet, Jpn. J. Appl. Phys, 10.7567/JJAP.52.050201, 52.0, 5.0, 050201, 52(5) (2013) 050201, 2013.05.
3. Masaru Itakura, Noriyuki Kuwano, Kaoru Sato and Shigeaki Tachibana, Variations in Contrast of Scanning Electron Microscope Images for Microstructure Analysis of Si-based Semiconductor Materials, J. Electron Microscopy, 59.0, Supple 1, S165-S173, 59, Supple 1(2010), S165-73., 2010.09.
4. Noriyuki Kuwano, Masaru Itakura, Yoshiyuki Nagatomo and Shigeaki Tachibana, Scanning Electron Microscope Observation of Dislocations in Semiconductor and Metal Materials, J. Electron Microscopy, 59.0, Supple 1, S175-S181, 59, Supple 1(2010), S175-S181, 2010.09.
5. Masaru Itakuraa, Shunji Masumori, Noriyuki Kuwano, Hiroshi Kanno, Taizoh Sadoh and Masanobu Miyao, Microscopic Studies of Metal-Induced Lateral Crystallization in SiGe, Appl. Phys. Lett., 96 (2010), 182101, 2010.05.
6. K. Hamaya, H. Itoh, O. Nakatsuka, K. Ueda, K. Yamamoto, M. Itakura, T. Taniyama, T. Ono, and M. Miyao, Ferromagnetism and Electronic Structures of Nonstoichiometric Heusler-Alloy Fe3-xMnxSi Epilayers Grown on Ge(111), Phys. Rev. Lett, 102 (2009), 137204, 2009.04.
7. M. Itakura, N. Kishikawa, R. Kawashita, N. Kuwano, Epitaxial orientation and morphology of β-FeSi2 produced on a flat and a patterned Si(001) substrates, Thin Solid Films, 515 (2007), 8169-8174, 2007.08.
8. N. Watanabe, M. Itakura, N. Kuwano, D. S. Li, S. Suzuki, K. Machida, Microstructure Analysis of Nd-Fe-B Sintered Magnets Improved by Tb-Vapor Sorption, Materials Transactions, 48(5), 915-918, 2007.05.
9. Masaru Itakura, Syunji Masumori, Yoshitsugu Tomokiyo, Noriyuki Kuwano, Hiroshi Kanno, Taizoh Sadoh, Masanobu Miyao, Microstructures of Si0.6Ge0.4 Thin Films Fabricated by Ni-metal Induced Lateral Crystallization, Proc. The 16th International Microscopy Congress, 1346.0, 2006.09.
10. Masaru Itakura, Tomohisa Ohta, Yoshitsugu Tomokiyo, Noriyuki Kuwano, Hiroshi Kanno, Taizoh Sadoh and Masanobu Miyao, Characterization of Metal-Induced Lateral Crystallization of Amorphous SiGe on Insulating Film, Thin Solid Films, 508, 57-60, 2006.04.
11. S. Hata, K. Shiraishi, M. Itakura, N. Kuwano T. Nakano and Y. Umakoshi, Long-period ordering in TiAl single crystal with gradient compositions, Phil. Mag. Lett., 10.1080/09500830500157462, 85.0, 4.0, 175-184, 85, 175-185, 2005.04.
12. Masaru Itakura, Tomohisa Ohta, Daigo Norizumi, Yoshitsugu Tomokiyo, Noriyuki Kuwano, Transmission electron microscope analysis of epitaxial growth processes in the sputtered β-FeSi2/Si(001) films, Thin Solid Films, 10.1016/j.tsf.2004.02.084, 461.0, 1.0, 120-125, 461, 120-125, 2004.07.
13. L. Y. Zhu, M. Itakura, Y. Tomokiyo, N. Kuwano and K. Machida, Corroded microstructure of HDDR-NdFeB magnetic powders, J. Mag. Mag. Mater., 10.1016/j.jmmm.2004.02.003, 279.0, 40211.0, 353-358, 279, 353-358, 2004.07.
14. M. Itakura, M. Nishimura, S. Takase, A. Ako, N. Kuwano and K. Oki, High Pressure Ce-LIII XANES Measurement Using an Asymmetrical Diamond Anvil Cell, Science and Technology of High Pressure, edited by M. H. Manghnani, W. J. Nellis and M. F. Nicol, Universities Press, Hyderabad, India, volume 1, pp. 479-482, 2000.11.
15. M. Itakura, N. Kuwano, K. Yamaguchi, T. Yoneki, K. Oki, R. Nakayama, N. Komada and T. Takeshita, TEM Study of Microstructural Changes in an Anisotropic Nd-Fe-Co-B-Zr Magnet Alloy during HDDR Process, Mater. Trans., JIM, 39.0, 1.0, 95-101, 39(1), 95-101, 1998.01.
16. R. Nakayama, T. Takeshita, M. Itakura, N. Kuwano and K. Oki, Microstructures and Crystallographic Orientation of Crystalline Grains in Anisotropic Nd-Fe-Co-B (Ga or Zr) Magnet Powders Produced by the Hydrogenation-Decomposition-Desorption-Recombination Process, J. Appl. Phys., 10.1063/1.357091, 76.0, 1.0, 412-417, 76(1), 412-417, 1994.07.
Presentations
1. Microstructures around the grain boundary region of Nd-Fe-B magnets analyzed by frontier electron microscopy.
2. Variations in contrast of scanning electron microscope images for microstructure analysis of Si-based semiconductor materials,

M. Itakura, N. Kuwano, K. Sato, S. Tachibana,

The Twelfth Frontiers of Electron Microscopy in Materials Science, Huis Ten Bosch, Sasebo, Japan, (2009 .9. 27-10. 2).
3. [Invited Talk] Electron Microscopy of Low Temperature Crystallization of a-SiGe Thin Film, Masaru Itakura, Masanobu Miyao (Kyushu Univ.).
Membership in Academic Society
  • The Magnetics Society of Japan
  • The Japan Institute of metals
  • The Japanese Society of Microscopy
  • The Japan Society of Applied Physics
Awards
  • IUMRS-ICA2008 Award for Encouragement of Research in Materials Science (Encouragement Prize for Young Researchers),
    Microstructure Analysis Of High Coercive PLD-Made NdFeB Thick-Film Improved By Tb-diffusion-Coating Treatment,
    M. Ishimaru, M. Itakura, M. Nishida, M. Nakano, H. Fukunaga,
    The IUMRS International Conference in Asia 2008, Nagoya Congress Center, Nagoya, Japan, (2008. 12. 9-13)
  • Microstructures of Si0.6Ge0.4 Thin Films Fabricated by Ni-metal Induced Lateral Crystallization
Educational
Other Educational Activities
  • 2018.11.
  • 2021.06.
  • 2018.03.
  • 2017.06.
  • 2017.03.
  • 2016.06.
  • 2016.03.
  • 2015.06.
  • 2015.03.
  • 2014.06.
  • 2014.03.
  • 2013.12.
  • 2013.09.
  • 2013.06.
  • 2013.03.
  • 2012.03.
  • 2010.07.
  • 2009.07.
  • 2008.07.
  • 2007.07.