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Masaru Itakura Last modified date：2020.07.20

Associate Professor / Optical and Electrical Materials
Department of Advanced Materials Science and Engineering
Faculty of Engineering Sciences


Graduate School
Department of Applied Science for Electronics and Materials
Interdisciplinary Graduate School of Engineering Sciences
Undergraduate School
Department of Energy Science and Engineering
School of Engineering


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Homepage
https://kyushu-u.pure.elsevier.com/en/persons/masaru-itakura
　Reseacher Profiling Tool　Kyushu University Pure
http://www.asem.kyushu-u.ac.jp/of/of01/root/welcome.html
Phone
092-583-7535
Fax
092-583-7534
Academic Degree
Dr. Eng.
Country of degree conferring institution (Overseas)
No
Field of Specialization
Physical Metallurgy, Crystallography, Solid State Physics
Total Priod of education and research career in the foreign country
00years00months
Research
Research Interests
  • Application of rare earth based multi-layered thick film magnets with in-plane anisotropy for ultra-miniature devices
    keyword : Nd-Fe-B permanent magnet, layered film magnet, microstructure、advanced electron microscopy
    2019.04～2022.03.
  • Development of SEM contrast-enhanced observation method for low-accelerated secondary electron images
    keyword : Scanning electron microscopy, Low-voltage SEM, Image contrast, Secondary electron image
    2019.04～2021.03.
  • Application of rare earth based multi-layered thick film magnets with in-plane anisotropy for ultra-miniature devices
    keyword : Nd-Fe-B permanent magnet, thick film magnet, pulsed laser deposition, power generation device, small motor, microstructure analysis
    2019.04～2022.03.
  • Development of innovative exchange coupling magnets with an excellent high temperature resistivity
    keyword : nano-composite, hard magnet, scanning electron microscopy, transmission electron microscopy, scanning transmission electron microscopy
    2017.04～2019.03Microstructural analysis of melting lateral growth GOI thin films on Si substrate.
  • Development of infrared sensor of magnesium silicide corresponding to the resource and the environmental risk
    keyword : magnesium silicide, scanning electron microscopy, transmission electron microscopy, scanning transmission electron microscopy
    2017.04～2019.03Microstructural analysis of melting lateral growth GOI thin films on Si substrate.
  • Development of nano-composite multilayered magnet films with controlled the interfaces
    keyword : hard magnetic materials, scanning electron microscopy, transmission electron microscopy, scanning transmission electron microscopy
    2016.04～2018.03Microstructural analysis of melting lateral growth GOI thin films on Si substrate.
  • Development and micro-fabrication of sub-mirimetor sized thick-film magnets by high-speed deposition for MEMS applications
    keyword : hard magnetic materials, scanning electron microscopy, transmission electron microscopy, scanning transmission electron microscopy
    2015.04～2017.03Microstructural analysis of melting lateral growth GOI thin films on Si substrate.
  • Atomic resolution microstructure analysis of high performance NdFeB-based model magnets
    keyword : hard magnetic materials, scanning electron microscopy, transmission electron microscopy, scanning transmission electron microscopy
    2015.04～2017.03Microstructural analysis of melting lateral growth GOI thin films on Si substrate.
  • Atomic resolution microstructure and chemical analysis of Sm-Co/α-Fe nanocomposite magnets
    keyword : hard magnetic materials, scanning electron microscopy, transmission electron microscopy, scanning transmission electron microscopy
    2015.04～2017.03Microstructural analysis of melting lateral growth GOI thin films on Si substrate.
  • Atomic resolution microstructure analysis of high performance hard magnetic materials controlled by nano-scale microstructure
    keyword : hard magnetic materials, scanning electron microscopy, transmission electron microscopy, scanning transmission electron microscopy
    2014.04～2016.03Microstructural analysis of melting lateral growth GOI thin films on Si substrate.
  • Fabrication of silicide nano-bulk crystals and their application for thermo-electronic devices
    keyword : silicides, nano-bulk, thermo-electronic devices, scanning electron microscopy, transmission electron microscopy, scanning transmission electron microscopy
    2013.04～2015.03Microstructural analysis of melting lateral growth GOI thin films on Si substrate.
  • Development of nano-columnar-type anisotropic nano-composite thick film magnets and their applications for next-generation magnetic devices
    keyword : nanocomposite, thick film magnets, scanning electron microscopy, transmission electron microscopy, scanning transmission electron microscopy
    2013.04～2016.03Microstructural analysis of melting lateral growth GOI thin films on Si substrate.
  • Control of anisotropic texture of NdFeB-type magnets by real dimensional microscopic analysis
    keyword : permanent magnet, anisotropy, scanning electron microscopy, transmission electron microscopy, scanning transmission electron microscopy
    2012.04～2016.03Microstructural analysis of melting lateral growth GOI thin films on Si substrate.
  • Search and microstructure control of new magnetic materials by using non-equilibrium phase
    keyword : new magnet, permanent magnet, scanning electron microscopy, transmission electron microscopy
    2011.10Microstructural analysis of melting lateral growth GOI thin films on Si substrate.
  • Microstructures analysis of Mn-silicides
    keyword : silicide, ecological friendly semiconductor, transmission electron microscope, scanning electron microscope
    2011.04～2012.03Microstructural analysis of melting lateral growth GOI thin films on Si substrate.
  • Microstructures analysis of Nd-Fe-B based magnet powders fabricated by HDDR process
    keyword : permanent magnet, coercivity, hybridization transmission electron microscope, scanning electron microscope
    2011.04Microstructural analysis of melting lateral growth GOI thin films on Si substrate.
  • Microstructures analysis of Nd-Fe-B based die-upset magnets
    keyword : permanent magnet, coercivity, microstructure, transmission electron microscope, scanning electron microscope
    2010.04Microstructural analysis of melting lateral growth GOI thin films on Si substrate.
  • Microstructures and coercivities of hydrogenated Nd-Fe-B based magnets
    keyword : permanent magnet, coercivity, microstructure, transmission electron microscope, scanning electron microscope
    2009.04～2012.03Microstructural analysis of melting lateral growth GOI thin films on Si substrate.
  • Microstructure analysis of GOI thin films fabricated by lateral liquid phase epitaxy method
    keyword : GOI, Ge thin film, transmission electron microscope, scanning electron microscope
    2008.06～2012.03Microstructural analysis of melting lateral growth GOI thin films on Si substrate.
  • Microstructure analysis of Si-Ge thin films fabricated by Al-induced crystallization
    keyword : metal-induced crystallization, low temperature crystallization, Si-Ge thin film, transmission electron microscope
    2008.04～2011.03Microstructure analysis of Si-Ge thin film fabricated by Aluminum Induced Crystallization method.
  • Low temperature crystallization mechanism for the indentation-induced crystallization of a-SiGe thin films
    keyword : indentation-induced crystallization, low temperature crystallization, Si-Ge thin film, transmission electron microscope, scanning electron microscope
    2008.02～2011.03Low temperature crystallization mechanism of amorphous SiGe thin filmes crystallized by nano-indentation method.
  • Microstructure analysis of semiconductor thin film materials by using low-voltage scanning electron microscope
    keyword : scanning electron microscope, image contrast,
    2006.04～2010.03.
  • Microstructure analysis of epitaxial grown beta-FeSi2 thin films
    keyword : iron disilicide, thin film, epitaxial growth
    2006.06～2010.03.
  • Microstructure analysis of high-quality crystalline beta-FeSi2 thin film fabricated by MOCVD method
    keyword : iron disilicide, thin film,
    2009.06.
  • Microstructure analysis of NdFeB sintered magnets improved by Tb vapor sorption treatment
    keyword : Nd-Fe-B magnet, high coercivity, Tb treatment
    2005.06～2012.03Microstructure Analysis of Nd-Fe-B sintered magnets improved by Tb metal vapor sorption.
  • Microstructure analysis of Nd-Fe-B thin film magnets fabricated by pulsed laser deposition
    keyword : pulsed laser deposition, thin film magnet, Nd-Fe-B, small size magnet, high coercivity
    2005.06.
  • Microstructure analysis of Zn-ferrite coated iron soft-magnetic compound materials
    keyword : soft-magnetic compound materials
    2004.04～2007.06.
  • Microstructures of [Fe3Si/FeSi2] magnetic semiconductor thin films
    keyword : evaporated film, magnetic films
    2004.04～2008.03Microstructure analysis of [Fe3Si/FeSi2] multilayered thin films on Si(111) substrates.
  • Microstructure analysis of amorphous SiGe thin film crystallized by Ni-MILC method
    keyword : SiGe, low temperature crystallization
    2003.07～2008.03Characterization of Metal-Induced Lateral Crystallization of Amorphous SiGe on Insulating Film.
  • Fabrication and Microstructural analysis of PLD-made Diamond Thin Films
    keyword : diamond thin film, PLD, Electron Microscopy
    2002.09～2005.03Microstructure of nanocrystalline diamond film prepared by pulsed laser deposition.
Current and Past Project
  • The Nanotechnology Researchers Network Project (Nanonet Project) "Ultra High-voltage Transmission Electron Microscope"
  • Research Core at Kyushu University "inorganic nano-superstructure"
  • Research Core at Kyushu University "Super microscope sciences"
Academic Activities
Books
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1. Electron Microscopy, Fundamental Techniques and Its Application 1998, pp.217-222 (1998)..
Reports
 Show All Reports >>
1. M. Itakura, N, Kishikawa, R. Kawashita, N. Kuwano, Epitaxial orientation and morphology of β-FeSi2 produced on a flat and a patterned Si(001) substrates, Annual Reports of HVEM Laboratory, Kyushu University, No. 30, 30号 (2006), 43-44, 2006.07.
2. M. Itakura, S. Masumori, Y. Tomokiyo, N. Kuwano, H. Kanno, T. Sadoh, M. Miyao, Microstructures of Si0.6Ge0.4 thin films fabricated by Ni-metal induced lateral crystallization, Annual Reports of HVEM Laboratory, Kyushu University, No. 30, 30号 (2006), 41-42, 2006.07.
3. M. Itakura, M. Ariyoshi, T. Fukuyama, N. Kuwano, Ce-LIII XANES and XRD measurements using an asymmetrical diamond anvil cell, Photon Factory Activity Report #20, 2002.10.
4. M. Itakura, M. Ariyoshi, T. Fukuyama, N. Kuwano, Ce-LIII XANES and XRD measurements using an asymmetrical diamond anvil cell, Photon Factory Activity Report, No. 20 (2002), 220., 2002.10.
5. M. Itakura, H. Maeda, T. Fukuyama, N. Kuwano, K. Oki, High Pressure Fluorescence Ce-LIII XANES Measurement and Its Application, Photon Factory Activity Report, No. 18 (2000), 99, 2000.10.
6. M. Itakura, A. Ako, N. Kuwano, K. Oki, High Pressure Ce-LIII XANES Measurement using a Diamond Anvil Cell, Photon Factory Activity Report, No. 17 (1999), 81, 1999.10.
7. M. Itakura, M. Nishimura, A. Ako, N. Kuwano, K. Oki, Ce-LIII X-ray Absorption Near Edge Structure Measurement using an Unsymmetrical Diamond Anvil Cell, Photon Factory Activity Report, No. 16 (1998), 208, 1998.10.
8. M. Itakura, M. Nishimura, S. Takase, N. Kuwano, K. Oki, New Method of Fluorescence Ce-L3 XANES Measurement using a Diamond Anvil Cell, Photon Factory Activity Report, No. 15 (1997), 116, 1997.10.
9. M. Itakura, N. Kuwano, Y. Ogata, N. Matsumoto, K. Oki, Observation of Pressure Induced 4f Electron Transition in an Amorphous Ce3Al Alloy by High Pressure Fluorescence XANES, Photon Factory Activity Report, No. 13 (1995), 237, 1995.10.
10. M. Itakura, Y. Aya, N. Kuwano, K. Oki,, Electrical Resistivity and Ce Valence Measurements Using XANES for a Pd5Ce Ordered Alloy, Photon Factory Activity Report, No. 9 (1991), 128, 1991.10.
11. Influence of Disordering upon Concentrated Kondo Effect for Pd7Ce Alloys.
12. Measurements of Mixed Valence of Ce by L3-XANES Analysis.
Papers
 Show All Papers >>
1. Masaru Itakura, Natsuki Watanabe, Minoru Nishida, 大尾 岳史, Syo Matsumura, Atomic-resolution X-ray Energy-dispersive Spectroscopy Chemical Mapping of Substitutional Dy Atoms in a High-coercivity Neodymium Magnet, Jpn. J. Appl. Phys, 10.7567/JJAP.52.050201, 52.0, 5.0, 050201, 52(5) (2013) 050201, 2013.05.
2. Masaru Itakura, Noriyuki Kuwano, Kaoru Sato and Shigeaki Tachibana, Variations in Contrast of Scanning Electron Microscope Images for Microstructure Analysis of Si-based Semiconductor Materials, J. Electron Microscopy, 59.0, Supple 1, S165-S173, 59, Supple 1(2010), S165-73., 2010.09.
3. Noriyuki Kuwano, Masaru Itakura, Yoshiyuki Nagatomo and Shigeaki Tachibana, Scanning Electron Microscope Observation of Dislocations in Semiconductor and Metal Materials, J. Electron Microscopy, 59.0, Supple 1, S175-S181, 59, Supple 1(2010), S175-S181, 2010.09.
4. Masaru Itakuraa, Shunji Masumori, Noriyuki Kuwano, Hiroshi Kanno, Taizoh Sadoh and Masanobu Miyao, Microscopic Studies of Metal-Induced Lateral Crystallization in SiGe, Appl. Phys. Lett., 96 (2010), 182101, 2010.05.
5. K. Hamaya, H. Itoh, O. Nakatsuka, K. Ueda, K. Yamamoto, M. Itakura, T. Taniyama, T. Ono, and M. Miyao, Ferromagnetism and Electronic Structures of Nonstoichiometric Heusler-Alloy Fe3-xMnxSi Epilayers Grown on Ge(111), Phys. Rev. Lett, 102 (2009), 137204, 2009.04.
6. M. Itakura, N. Kishikawa, R. Kawashita, N. Kuwano, Epitaxial orientation and morphology of β-FeSi2 produced on a flat and a patterned Si(001) substrates, Thin Solid Films, 515 (2007), 8169-8174, 2007.08.
7. N. Watanabe, M. Itakura, N. Kuwano, D. S. Li, S. Suzuki, K. Machida, Microstructure Analysis of Nd-Fe-B Sintered Magnets Improved by Tb-Vapor Sorption, Materials Transactions, 48(5), 915-918, 2007.05.
8. Masaru Itakura, Syunji Masumori, Yoshitsugu Tomokiyo, Noriyuki Kuwano, Hiroshi Kanno, Taizoh Sadoh, Masanobu Miyao, Microstructures of Si0.6Ge0.4 Thin Films Fabricated by Ni-metal Induced Lateral Crystallization, Proc. The 16th International Microscopy Congress, 1346.0, 2006.09.
9. Masaru Itakura, Tomohisa Ohta, Yoshitsugu Tomokiyo, Noriyuki Kuwano, Hiroshi Kanno, Taizoh Sadoh and Masanobu Miyao, Characterization of Metal-Induced Lateral Crystallization of Amorphous SiGe on Insulating Film, Thin Solid Films, 508, 57-60, 2006.04.
10. S. Hata, K. Shiraishi, M. Itakura, N. Kuwano T. Nakano and Y. Umakoshi, Long-period ordering in TiAl single crystal with gradient compositions, Phil. Mag. Lett., 10.1080/09500830500157462, 85.0, 4.0, 175-184, 85, 175-185, 2005.04.
11. Masaru Itakura, Tomohisa Ohta, Daigo Norizumi, Yoshitsugu Tomokiyo, Noriyuki Kuwano, Transmission electron microscope analysis of epitaxial growth processes in the sputtered β-FeSi2/Si(001) films, Thin Solid Films, 10.1016/j.tsf.2004.02.084, 461.0, 1.0, 120-125, 461, 120-125, 2004.07.
12. L. Y. Zhu, M. Itakura, Y. Tomokiyo, N. Kuwano and K. Machida, Corroded microstructure of HDDR-NdFeB magnetic powders, J. Mag. Mag. Mater., 10.1016/j.jmmm.2004.02.003, 279.0, 40211.0, 353-358, 279, 353-358, 2004.07.
13. M. Itakura, M. Nishimura, S. Takase, A. Ako, N. Kuwano and K. Oki, High Pressure Ce-LIII XANES Measurement Using an Asymmetrical Diamond Anvil Cell, Science and Technology of High Pressure, edited by M. H. Manghnani, W. J. Nellis and M. F. Nicol, Universities Press, Hyderabad, India, volume 1, pp. 479-482, 2000.11.
14. M. Itakura, N. Kuwano, K. Yamaguchi, T. Yoneki, K. Oki, R. Nakayama, N. Komada and T. Takeshita, TEM Study of Microstructural Changes in an Anisotropic Nd-Fe-Co-B-Zr Magnet Alloy during HDDR Process, Mater. Trans., JIM, 39.0, 1.0, 95-101, 39(1), 95-101, 1998.01.
15. R. Nakayama, T. Takeshita, M. Itakura, N. Kuwano and K. Oki, Microstructures and Crystallographic Orientation of Crystalline Grains in Anisotropic Nd-Fe-Co-B (Ga or Zr) Magnet Powders Produced by the Hydrogenation-Decomposition-Desorption-Recombination Process, J. Appl. Phys., 10.1063/1.357091, 76.0, 1.0, 412-417, 76(1), 412-417, 1994.07.
Presentations
 Show All Presentations >>
1. Microstructures around the grain boundary region of Nd-Fe-B magnets analyzed by frontier electron microscopy.
2. Variations in contrast of scanning electron microscope images for microstructure analysis of Si-based semiconductor materials,

M. Itakura, N. Kuwano, K. Sato, S. Tachibana,

The Twelfth Frontiers of Electron Microscopy in Materials Science, Huis Ten Bosch, Sasebo, Japan, (2009 .9. 27-10. 2).
3. [Invited Talk] Electron Microscopy of Low Temperature Crystallization of a-SiGe Thin Film, Masaru Itakura, Masanobu Miyao (Kyushu Univ.).
Membership in Academic Society
  • The Magnetics Society of Japan
  • The Japan Institute of metals
  • The Japanese Society of Microscopy
  • The Japan Society of Applied Physics
Awards
  • IUMRS-ICA2008 Award for Encouragement of Research in Materials Science (Encouragement Prize for Young Researchers),
    Microstructure Analysis Of High Coercive PLD-Made NdFeB Thick-Film Improved By Tb-diffusion-Coating Treatment,
    M. Ishimaru, M. Itakura, M. Nishida, M. Nakano, H. Fukunaga,
    The IUMRS International Conference in Asia 2008, Nagoya Congress Center, Nagoya, Japan, (2008. 12. 9-13)
  • Microstructures of Si0.6Ge0.4 Thin Films Fabricated by Ni-metal Induced Lateral Crystallization
Educational
Other Educational Activities
  • 2018.11.
  • 2018.06.
  • 2018.03.
  • 2017.06.
  • 2017.03.
  • 2016.06.
  • 2016.03.
  • 2015.06.
  • 2015.03.
  • 2014.06.
  • 2014.03.
  • 2013.12.
  • 2013.09.
  • 2013.06.
  • 2013.03.
  • 2012.03.
  • 2010.07.
  • 2009.07.
  • 2008.07.
  • 2007.07.


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