| 1. |
Hakaru Mizoguchi, Kentaro Tomita, Daisuke Nakamura, Kouichiro Kouge, Yukihiko Yamagata, Yiming Pan, Atsushi Sunahara, Takeshi Higashiguchi, Katsunobu Nishihara, Toru Ogawa, Takashi Tanaka, Masaharu Shiratani,, Plasma Dynamics and Future of LPP-EUV Source for Semiconductor Manufacturing, Proceedings of the (Kyoto, Japan, Sept. 10–14, 2023), G8, 2023.09., 20th International Symposium on Laser-Aided Plasma Diagnostics, 2023.09. |
| 2. |
Hakaru Mizoguchi, Kentaro Tomita, Yiming Pan, Atsushi Sunahara, Kouichiro Kouge, Katsunobu Nishihara, Daisuke Nakamura, Yukihiro Yamagata, Masaharu Shiratani, Plasma Dynamics and Future of LPP-EUV Source for Semiconductor Manufacturing, 2023 EUVL Workshop and Supplier Showcase, 2023.06. |
| 3. |
K. Miyoshi, Y. Yamagata, T. Shimada, Y. Manabe, M. Horiuchi
, Remote measurement of junction temperature of blue-LED module using pulsed-laser Raman scattering, MRM2021 Materials Research Meeting, 2021.12. |
| 4. |
N. Kobayashi, Y. Kawaguchi, Y Yamagata, F. Miyazaki, J. Tanaka, K Muraoka, Spatially-resolved velocity distribution function of thermal spray droplets obtained using a velocity-divided Abel conversion of photographic data, The 19th Cross Straits Symposium on Energy and Environmental Science and Technology, 2017.11. |
| 5. |
堀内 誠, 山形幸彦, 富田健太郎, 真鍋由雄, Pulsed-laser Raman scattering for simultaneous estimation of junction temperatures in a LED module, BIT’s 6th Annual World Congress of Advanced Materials-2017, 2017.06, For LED and other semiconductor power devices in which integration and high current operation are required, the efficiency, the lifetime, and the operational stability degrade remarkably resulting from the temperature rise of the junction of these devices. Therefore, in order to fabricate a high quality device, junction temperature measurement of the device in operation, and the heat radiation design of the whole device based on the experimental results are primary important. In this study a novel method by using a pulsed-laser Raman scattering technique was employed to estimate junction temperatures of a phosphor-less blue-LED module. Observation of GaN-E2H Raman spectra was done successfully and temperature dependent Raman spectra of GaN were detected. This technique was applied to simultaneous estimation of the junction temperatures of the several chips in the phosphor-less blue LED module in operation. It is concluded that this technique would be a useful method for remoteness and simultaneous multipoint measurement, which lead to 2D mapping of the junction temperature of a white-LED in which several chips are integrated.. |
| 6. |
山形 幸彦, Pulsed-laser Raman scattering for measurement of junction temperature of white-LED, the 5th International Conference and Exhibition on Lasers, Optics and Photonics, 2016.11, Recently, the characteristic of a light emitting diode (LED) has been improved dramatically, and the application to illumination is recognized as one of the most important issue to the manufacturers. It is well known that the efficiency, the output power, the life-time and the reliability of LED degrade with a temperature rise of the junction of LED. In order to fabricate a high quality LED module for illumination, it is necessary to keep the junction temperature low by improving the characteristic of LED chip itself, or by effective heat removal through a heat radiation design of the module. Therefore, it is strongly required to establish a standard method to measure the junction temperatures in LED module. Although several techniques, such as micro-Raman spectroscopy, infrared imaging, temperature coefficient of diode-forward voltage and so on, are applied to estimate the junction temperature, there is no method that can simultaneously measure the junction temperature of the several chips located in a LED module, especially in a phosphor-deposited white-LED. Under these situations, we have been developing a pulsed-laser Raman scattering method for estimation of the junction temperature of LED, where the Raman shift of E2H mode of GaN layer is observed. This method has potentials of remoteness and simultaneous multipoint measurement, which lead to 2D mapping of the temperature of the LED module. This technique has been applied successfully to measure the junction temperature of phosphor-less blue-LED, and is considered to be one of the prospective candidates of temperature estimation method of white-LED. In this presentation, simultaneous observation of Raman spectra from several LED chips in a phosphor-less blue-LED module by a pulsed-laser Raman scattering method is demonstrated. Also, the influence of a phosphor deposited on the surface of blue-LED on Raman spectra is discussed.. |
| 7. |
堤晋一, 堀内 誠, 富田 健太郎, 真鍋由雄, 山形 幸彦, Influence of phosphor on junction-temperature measurement of white-LED using pulsed-laser Raman scattering, 15th International Symposium on Science and Technology of Lighting, 2016.05. |
| 8. |
堀内 誠, 堤晋一, 富田 健太郎, 真鍋由雄, 山形 幸彦, Development of simultaneous measurement system of junction temperatures in a LED module using pulsed-laser Raman scattering, 15th International Symposium on Science and Technology of Lighting, 2016.05. |
| 9. |
中川憲抄, 高倉隆太, 山形 幸彦, 内野 喜一郎, 河合 良信, Control of VHF plasma generation area for large scale plasma applications, 16th Cross Straits Symposium on Energy and Environmental Science and Technology, 2014.11. |
| 10. |
山形 幸彦, 堀内 誠, 富田 健太郎, 真鍋由雄, Development of temperature measurement system for LED junction using pulsed-laser Raman scattering, 14th International Symposium on Science and Technology of Lighting, 2014.06. |
| 11. |
山形 幸彦, 富田 健太郎, 永井和彦, 清水陽大, Nima Bolouki, 内野 喜一郎, Thomson Scattering Measurements of Atmospheric Plasmas Contacting with Ionic Liquids, 5th International Conference on Plasma Medicine, 2014.05. |
| 12. |
Nima Bolouki, 富田 健太郎, 山形 幸彦, 内野 喜一郎, Diagnostics of Streamer Discharges Using Laser Thomson Scattering at Around Atmospheric Pressure, 26th Symposium on Plasma Science and Materials (Kyushu Univesity, Fukuoka, Japan, Sep. 23-24, 2013) 23p-A-2, 2013, 2013.09. |
| 13. |
富田 健太郎, 永井和彦, 山形 幸彦, 内野 喜一郎, Measurements of Electron Density and Electron Temperature of Atmospheric Pressure Plasmas Generated with Liquid Electrodes, JSAP-MRS Joint Symposia for 2013 JSAP Autumn Meeting, 2013.09. |
| 14. |
Nima Bolouki, 永田健太郎, 富田 健太郎, 山形 幸彦, 内野 喜一郎, パルス放電ストリーマ進展過程のトムソン散乱計測, 第60回応用物理学会春季学術講演会, 2013.03. |
| 15. |
富田 健太郎, 山形 幸彦, 内野 喜一郎, Thomson Scattering Diagnostics of Atmospheric Pressure Plasmas Generated with Ionic Liquid Electrode, The 6th International Conference on Plasma Nano Technology and Science, 2013.02. |
| 16. |
富田 健太郎, Nima Bolouki, 山形 幸彦, 内野 喜一郎, Thomson Scattering Diagnostics of Pulsed Filament Discharges Produced at Near-Atmospheric Pressure, 5th International Symposium on Advanced Plasma Science and Its Applications for Nitrides and Nanomaterials (ISPlasma 2013), 2013.01. |
| 17. |
山形 幸彦, Makoto Kai, 富田 健太郎, 内野 喜一郎, Yoshio Manabe, Clarification of emitter loss mechanism for a design of highly efficient and long-lived fluorescent lamp, International LIGLR Workshop (Jan. 25, Chikushi Campus, Kyushu University, Japan) 2013., 2013.01. |
| 18. |
Nima Bolouki, 富田 健太郎, 山形 幸彦, 内野 喜一郎, Laser Thomson scattering diagnostics of pulsed filamentary discharge, 65th Annual Gaseous Electronics Conference, 2012.10. |
| 19. |
富田 健太郎, Nima Bolouki, 山形 幸彦, 内野 喜一郎, Studies of Pulsed Discharge Plasmas Produced at Atmospheric Pressure using Laser Thomson Scattering, International Union of Material Research Societies - International Conference on Electronic Materials 2012(IUMRS-ICEM 2012), 2012.09. |
| 20. |
Nima Bolouki, 富田 健太郎, 山形 幸彦, 内野 喜一郎, Diagnostics of Nano Seconds Pulsed Discharge Plasmas Using Laser Thomson Scattering, 第73回 応用物理学関係連合講演会, 2012.09. |
