Kyushu University Academic Staff Educational and Research Activities Database
List of Reports
DONG WANG Last modified dateļ¼š2024.04.15

Professor / Department of Internationalization and Future Conception / Faculty of Engineering Sciences

1. [Strained Si wafer technology for high-speed LSI]
Although Si-LSI technology has achieved high-speed and low-power-consumption devices by device shrinkage, there is a possibility that the device shrinkage will encounter difficulties. Thus, next-generation LSI technology requires an alternative method of achieving high-performance devices. A strained Si/SiGe heterostructure has a large potential, because Si on strain-relaxed SiGe receives tensile strain, causing the enhancement of carrier mobility. We have demonstrated a 200 mm strained-Si wafer fabrication technique. In this report, we introduce this fabrication technique and the electrical properties of the fabricated wafer. A test circuit was also fabricated to characterize the quality of the strained Si wafer. In addition, we introduce a technique of enhancing the strain relaxation of a SiGe virtual substrate on SiO2. , [URL].