Kyushu University Academic Staff Educational and Research Activities Database
List of Reports
Mitsuhiro Murayama Last modified date:2021.08.02

Professor / Department of Integrated Materials / Institute for Materials Chemistry and Engineering

1. Steven R. Spurgeon, Colin Ophus, Lewys Jones, Amanda Petford-Long, Sergei V. Kalinin, Matthew J. Olszta, Rafal E. Dunin-Borkowski, Norman Salmon, Khalid Hattar, Wei-Chang D. Yang, Renu Sharma, Yingge Du, Ann Chiaramonti, Haimei Zheng, Edgar C. Buck, Libor Kovarik, R. Lee Penn, Dongsheng Li, Xin Zhang, Mitsuhiro Murayama, Mitra L. Taheri, Towards data-driven next-generation transmission electron microscopy, Nature Materials,, 2020.10, Electron microscopy touches on nearly every aspect of modern life, underpinning materials development for quantum computing, energy and medicine. We discuss the open, highly integrated and data-driven microscopy architecture needed to realize transformative discoveries in the coming decade..
2. S. Hata, T. Honda, H. Saito, M. Mitsuhara, T.C. Petersen, M. Murayama, Electron tomography: An imaging method for materials deformation dynamics, Current Opinion in Solid State and Materials Science,, IF = 9.571, 2020.02, [URL], The combination of in-situ and three-dimensional (3D) in transmission electron microscopy (TEM) is one of the emerging topics of recent advanced electron microscopy research. However, to date, there have been only handful examples of in-situ 3D TEM for material deformation dynamics. In this article, firstly, the authors briefly review technical developments in fast tilt-series dataset acquisition, which is a crucial technique for in-situ electron tomography (ET). Secondly, the authors showcase a recent successful example of in-situ specimen-straining and ET system development and its applications to the deformation dynamics of crystalline materials. The system is designed and developed to explore, in real-time and at sub-microscopic levels, the internal behavior of polycrystalline materials subjected to external stresses, and not specifically targeted for atomic resolution (although it may be possible). Technical challenges toward the in-situ ET observation of 3D dislocation dynamics are discussed for commercial structural crystalline materials, including some of the early studies on in-situ ET imaging and 3D modeling of dislocation dynamics. A short summary of standing technical issues and a proposed guideline for further development in the 3D imaging method for dislocation dynamics are then discussed..
3. Satoshi Hata, Hiromitsu Furukawa, Takashi Gondo, Daisuke Hirakami, Noritaka Horii, Ken-Ichi Ikeda, Katsumi Kawamoto, Kosuke Kimura, Syo Matsumura, Masatoshi Mitsuhara, Hiroya Miyazaki, Shinsuke Miyazaki, Mitsuhiro Murayama, Hideharu Nakashima, Hikaru Saito, Masashi Sakamoto, Shigeto Yamasaki, Electron tomography imaging methods with diffraction contrast for materials research,, 2020.06, [URL], Transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) enable the visualization of three-dimensional (3D) microstructures ranging from atomic to micrometer scales using 3D reconstruction techniques based on computed tomography algorithms. This 3D microscopy method is called electron tomography (ET) and has been utilized in the fields of materials science and engineering for more than two decades. Although atomic resolution is one of the current topics in ET research, the development and deployment of intermediate-resolution (non-atomic-resolution) ET imaging methods have garnered considerable attention from researchers. This research trend is probably not irrelevant due to the fact that the spatial resolution and functionality of 3D imaging methods of scanning electron microscopy (SEM) and X-ray microscopy have come to overlap with those of ET. In other words, there may be multiple ways to carry out 3D visualization using different microscopy methods for nanometer-scale objects in materials. From the above standpoint, this review paper aims to (i) describe the current status and issues of intermediate-resolution ET with regard to enhancing the effectiveness of TEM/STEM imaging and (ii) discuss promising applications of state-of-the-art intermediate-resolution ET for materials research with a particular focus on diffraction contrast ET for crystalline microstructures (superlattice domains and dislocations) including a demonstration of in situ dislocation tomography..